Reviewer :
Micro & Nano Letters, IET
Semiconductor Science and Technology, IOP Science
Journal of Alloys and Compounds, Elsevier
Microelectronics Reliability, Elsevier
Physica B: Condensed Matter, Elsevier
Physica E: Low-dimensional systems and nanostructures, Elsevier
Journal of Electron Device Soceity, IEEE
Electron Device Letters, IEEE
Transaction on Device and Materials Reliability, IEEE
Applied Materials and Interfaces, ACS
Journal of Applied Physics, AIP
Sadhana, Springer
IEEE Nano 2017, Pittsburgh, USA (conference)