Growth and operations of cluster tool based production style (6") Molecular Beam Epitaxy (MBE)for Nitride, Arsenide & SiGe, SVT Associates, USA.
Growth and operations of Desktop MBE (Riber C12).
High Resolution XRD (Bede D1, Jordon Valley).
IV – CV Characterization by Keithley SCS 4200, 2430 and 2651A under DC probe station.
Low temperature (LN2) Hall, Photoluminescence (RT) and Electrolytic-CV measurement(Nano-metrics).
Small Signal RF Characterization of DUT, Cascade RF probe station and VNA (Agilent N5230C).
Microcontroller (PIC) and its application.
Programmable Logic Controller and its application.